Session 5(A) - New materials and structures (incl. nanostructures and thin films), their analysis and specific applications II.

Session 5(A) - New materials and structures (incl. nanostructures and thin films), their analysis and specific applications II. Kostič I., Glezos N., Konečníková A., Matay L., Nemec P., Písečný P., Velessiotis D. Limits to nanopatterning based on e-beam lithography Murín J., Hrabovský J., Paulech J., Kutiš V. Effective material properties calculation of the FGm Bar structures Novák P., Dobročka E., Búc D., Kováč J. Determination of residual stress in thin film by GIXRD Rehák M., Neilinger P., Žemlička M., Manca D., Hübner U., Il’ichev E., Grajcar M. Switching effect in SQUIDs coupled by Josephson junction Zigo J., Švec P., Janičkovič D., Janotová I., Maťko I., Švec P. Sr. Structure of new Al-Si based RQ systems with potentially enhanced stiffness Hrkút P., Andok R., Benčurová A., Nemec P., Konečníková A., Matay L., Haščík Š. RIE plasma etching of GaAs in SiCl4 and CCl4 gases with different resists as etch masks