Session 4B - Solid state characterization and analysis

Session 4B - Solid state characterization and analysis V. Ac, J. Kasala, D. Korytar, Z. Zaprazny, P. Konopka Practical experiences with X-ray micro tomography of aluminium alloys Z. Zaprazny, D. Korytar, V. Ac, P. Konopka, J. Bielecki Computerized tomography using high resolution X-ray imaging system with a microfocus source J. Kovac jr., J. Kovac, J. Hotovy, I. Novotny, J. Skriniarova, E. Dutkova and P. Balaz Electrical characterisation of semiconductor structures using AFM techniques M. Misun, M. Tomaska Thermal analysis of microwave high-temperature probe station E. Vavrinsky, L. Prusakova, J. Tesar, P. Sutta, V. Tvarozek, P. Benko Resistivity measurement and conductivity type determination for semiconducting materials using a four-point probe R. Kinder, M. Mikolasek, J. Kovac, M. Tlaczala Hall and a four point probe for characterization of semiconductors