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<title>Electrical Measurements</title>
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<author>H. Frank</author>						
<title>Measurements of zirconium alloy oxide layers</title>
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<author>V. Ďurman, V. Šály</author>						
<title>Slow polarization processes in dielectric structures</title>
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<author>D. Fidríková, Ľ. Kubičár</author>						
<title>Investigation of water diffusion in porous stones using transient hot-ball method</title>
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<author>M. Nemec, M. Jurkovič , L. Harmatha, P. Mokryš, B. Weber, P. Písečný, K. Fröhlich</author>						
<title>Characterization of MOS structures by conductance method</title>
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<author>J. Šebok, M. Petrus, Ľ. Stuchlíková, L.Harmatha, J. Kováč, M. Nemec, J.Benkovská, J. Škriniarová</author>						
<title>Study of electrical properties of GaN by capacitance methods</title>
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<author>Ľ. Stuchlíková, J. Šebok, M. Petrus, L.Harmatha, J.Benkovská, J. Kováč, J. Škriniarová, T. Lalinský, R. Paskiewicz, M. Tlaczala</author>						
<title>Deep energy levels in Al0.19Ga0,81N/GaN single-quantum-well structures</title>
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<author>M. Žiška, L. Harmatha</author>						
<title>Interface trap density of mos ncz structure after irradiation with Xe heavy ions</title>
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<author>P. Benko, L. Harmatha, I. Novotný, V. Řeháček, A. Vincze</author>						
<title>	Electrical characterization of MOS structures with nickel gate electrodes</title>
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